Integrated test and package methods for integrated photonics
Arrangements of discrete photonic waveguide devices are currently being integrated to form circuits. These Photonic Integrated Circuits (PICS) require test methods that are adaptable as circuit size and complexity grows. Here, we describe tests used to characterize a GaAs/GaAlAs waveguide-based PIC being developed for phase-shift control in phased-array antenna applications. The various elements of the PIC include digital and analog waveguide modulators, light-guide splitters and combiners, turning mirrors, and input-output polarization-maintaining single-mode optical fibers. These basic elements are combined to perform higher-order functions such as optical frequency translation (single side-band suppressed carrier modulation), and phase shifting on multiple optical taps. Tests used to characterize the elements include optical loss, guided-wave modal characteristics, antireflection coating effectiveness, electro-optical (phase) modulation efficiency, electrical frequency response, and optical frequency translation. These tests are integrated with the fiber attachment and RF packaging sequence to construct working device prototypes. They are currently being applied to discrete components of the circuit, and will be adapted as the various parts are integrated.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE; USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC04-76DP00789
- OSTI ID:
- 6976455
- Report Number(s):
- SAND-92-0650C; CONF-9209184-4; ON: DE93000748
- Resource Relation:
- Conference: The International Society for Optical Engineering (SPIE) meeting, Boston, MA (United States), 8-11 Sep 1992
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
ANTENNAS
INTEGRATED CIRCUITS
TESTING
ALUMINIUM ARSENIDES
ELECTRICAL TESTING
ELECTRO-OPTICAL EFFECTS
FABRICATION
GALLIUM ARSENIDES
PHASE SHIFT
WAVEGUIDES
ALUMINIUM COMPOUNDS
ARSENIC COMPOUNDS
ARSENIDES
ELECTRICAL EQUIPMENT
ELECTRONIC CIRCUITS
EQUIPMENT
GALLIUM COMPOUNDS
MATERIALS TESTING
MICROELECTRONIC CIRCUITS
NONDESTRUCTIVE TESTING
PNICTIDES
426000* - Engineering- Components
Electron Devices & Circuits- (1990-)