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Y-Ba-Cu-O thin films grown on rigid and flexible polycrystalline yttria-stabilized zirconia by pulsed laser ablation

Journal Article · · Journal of Applied Physics; (USA)
DOI:https://doi.org/10.1063/1.347121· OSTI ID:6974973
; ; ;  [1]; ;  [2]; ;  [3]; ;  [4]
  1. Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (USA)
  2. Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 and The University of Tennessee, Knoxville, Tennessee 37996 (USA)
  3. Corning Incorporated, Research and Development Division, Corning, New York 14831 (USA)
  4. General Electric Corporate Research and Development, Schenectady, New York 12301 (USA)

{ital In} {ital situ} growth of highly oriented YBa{sub 2}Cu{sub 3}O{sub 7{minus}{ital x}} thin films (200--500 nm in thickness) has been obtained by pulsed KrF (248 nm) laser ablation on both rigid and flexible randomly oriented polycrystalline yttria-stabilized zirconia substrates. It is shown that {ital c}-axis-perpendicular YBa{sub 2}Cu{sub 3}O{sub 7{minus}{ital x}} films with a mosaic spread of only 1.0{degree} can be grown on these randomly oriented polycrystalline substrates. Superconducting thin films were obtained with {ital T}{sub {ital c}}({ital R}=0){similar to}89 K on well-polished substrates. For the films deposited on the flexible substrates, the superconducting {ital T}{sub {ital c}} is not degraded by repeated bending of the flexible substrate/film composite over a 2.25-cm-radius arc although the normal-state resistivity increases slightly, suggesting the creation of microcracks. The YBa{sub 2}Cu{sub 3}O{sub 7{minus}{ital x}} films grown on rigid polycrystalline yttria-stabilized zirconia substrates have a critical current density {ital J}{sub {ital c}}({ital H}=0){similar to}1400 A/cm{sup 2} at 77 K.

DOE Contract Number:
AC05-84OR21400
OSTI ID:
6974973
Journal Information:
Journal of Applied Physics; (USA), Journal Name: Journal of Applied Physics; (USA) Vol. 68:1; ISSN 0021-8979; ISSN JAPIA
Country of Publication:
United States
Language:
English