Characteristics of a 'HARP' signal processor with analog memory operated with segmented silicon detectors

Conference · Mon Aug 01 00:00:00 EDT 1994 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

OSTI ID:6974216

Anghinolfi, F; Aspell, P ^[1]; Bonino, R ^[2]

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1. CERN, Geneva (Switzerland)
2. Geneva Univ. (Switzerland); and others

For future particle experiments, the detector systems will have a large number of detecting elements, and these will provide raw data at [approximately] 50 MHz rates. As an example, the silicon outer tracker (SIT) for the ATLAS detector may consist of 5 planes of silicon strip and pad detectors with 390,000 independent channels per plane. The signal processing electronics must comply with the strong limitation on electrical power and cooling in the central barrel. A 32 channel analog VLSI detector readout chip (HARP32) with an input charge preamplifier, a 64-cell current integrating analog memory in each channel and a common analog multiplexer, has been used in a test beam with segmented silicon detectors. The device was operated at the LHC clock speed of 66 MHz. The different pedestal variations seen at the output are analyzed: the input noise [sigma][sub n] amounts to 2.8mV r.m.s., the pedestal non-uniformity in channel [sigma][sub ped] to 1.2mV r.m.s., the channel to channel pedestal variation [sigma][sub ch] to 4.0mV r.m.s., and an output baseline shift [sigma][sub obs] of 3.5mV r.m.s. has been observed.

• OSTI ID: 6974216
• Report Number(s): CONF-931051-; CODEN: IETNAE; TRN: 94-023020
• Journal Information: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Vol. 41:4Pt1; Conference: NSS-MIC '93: nuclear science symposium and medical imaging conference, San Francisco, CA (United States), 30 Oct - 6 Nov 1993; ISSN 0018-9499
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
READOUT SYSTEMS
PERFORMANCE
SI SEMICONDUCTOR DETECTORS
ANALOG SYSTEMS
INTEGRATED CIRCUITS
OPERATION
ELECTRONIC CIRCUITS
MEASURING INSTRUMENTS
MICROELECTRONIC CIRCUITS
RADIATION DETECTORS
SEMICONDUCTOR DETECTORS
440104* - Radiation Instrumentation- High Energy Physics Instrumentation