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Coincident detection of electrons ejected at large angles and target recoil ions produced in multiply-ionizing collisions for the 1 MeV/u O[sup q+] (q = 4,7) + Ar collision system

Thesis/Dissertation ·
OSTI ID:6971997
The author has designed and constructed a new multi-spectrometer system for use in ion-atom collision experiments. This new multi-spectrometer system can detect electrons ejected at 0[degrees], 180[degrees], and into a angular range from about 45[degrees] to about 135[degrees] measured relative to the incident beam direction as well as the recoil ions produced in ion-atom collisions. In these experiments the author has measured, in coincidence, the angular distributions of electrons ejected into an angular range from about 45[degrees] to about 135[degrees] relative to the incident beam direction and the target recoil ions produced in multiply-ionizing collisions for the 1 MeV/u O[sup q+] ( q= 4,7) + Ar collision systems. These measurement have been performed for 179 eV, 345 eV, and 505 eV electrons. Additionally, the author has measured the energy distributions of electrons ejected into specific angular regions. The goal of the experiments is to determine whether of not binary encounter precesses alone can explain the angular distributions of electrons ejected at large angles in multiply ionizing collisions. The angular distributions measured for each electron energy are strongly peaked in the forward direction. The results are consistent with the dominant product mechanism for electrons ejected at large angles being a binary encounter process. No evidence is seen for [open quotes]hot[close quotes] electrons, which are energetic electrons ejected at large angles from the incident beam direction in addition to binary encounter electrons. Differential cross sections have been calculated from these angular distributions. They are on the order of 10[sup [minus]21] cm[sup 2]/eV ster.
Research Organization:
Tennessee Univ., Knoxville, TN (United States)
OSTI ID:
6971997
Country of Publication:
United States
Language:
English