A preliminary research on the microstructure and the mechanical properties of TiAl + Ti{sub 5}Si{sub 3} dual phase alloys
Journal Article
·
· Scripta Metallurgica et Materialia
- Shanghai Jiao Tong Univ. (China). Inst. of Materials Science and Engineering
In this paper, following the idea of dual phase alloys, the authors dealt with the TiAl based Ti-Al-Si ternary alloys. The investigation was carried out to understand the basic properties of these alloys. Emphasis was placed on the relationship between microstructures and mechanical properties. Their present study has shown that a sufficient Si addition to the TiAl matrix resulted in TiAl + Ti{sub 5}Si{sub 3} dual phase alloys. The microstructure was coupled-growth in general which could be characterized as eutectic, hypoeutectic and hypereutectic. The second phase Ti{sub 5}Si{sub 3} contributed to the enforcement of the matrix, which was the expected result. However, high Si and Al contents resulted in low ductility and fracture strength. This was because of the coarse Ti{sub 5}Si{sub 3} primary phases and the embrittlement of the matrix. So in the view of alloy design, emphasis should be placed on the hypoeutectic and eutectic alloys, and adjusting the amount and shape of Ti{sub 5}Si{sub 3} in the Ti rich TiAl matrix may shed some light on their practical use in the future.
- OSTI ID:
- 69662
- Journal Information:
- Scripta Metallurgica et Materialia, Journal Name: Scripta Metallurgica et Materialia Journal Issue: 10 Vol. 32; ISSN SCRMEX; ISSN 0956-716X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
ALUMINIUM ALLOYS
COMPRESSION STRENGTH
EXPERIMENTAL DATA
FRACTURE PROPERTIES
INTERMETALLIC COMPOUNDS
MECHANICAL PROPERTIES
MICROSTRUCTURE
MORPHOLOGY
PARTICLES
SAMPLE PREPARATION
SCANNING ELECTRON MICROSCOPY
SILICON ALLOYS
TERNARY ALLOY SYSTEMS
TITANIUM ALLOYS
WHISKERS
X-RAY DIFFRACTION
ALUMINIUM ALLOYS
COMPRESSION STRENGTH
EXPERIMENTAL DATA
FRACTURE PROPERTIES
INTERMETALLIC COMPOUNDS
MECHANICAL PROPERTIES
MICROSTRUCTURE
MORPHOLOGY
PARTICLES
SAMPLE PREPARATION
SCANNING ELECTRON MICROSCOPY
SILICON ALLOYS
TERNARY ALLOY SYSTEMS
TITANIUM ALLOYS
WHISKERS
X-RAY DIFFRACTION