Layer-by-layer melting of argon films on graphite: A neutron-diffraction study
Journal Article
·
· Physical Review Letters; (USA)
- Brookhaven National Laboratory, Upton, New York 11973 (US)
Elastic neutron diffraction is used to study the melting of multilayer argon films physisorbed on a graphite substrate. The layers are found to disorder sequentially from the outermost layer of the film toward the graphite surface with the melting of individual layers occurring gradually over a temperature range of about 10{degree}. For films initially two or more layers thick the melting of the layer closest to the substrate occurs near 100 K. Comparisons are made with recent computer simulations and with thermodynamic measurements.
- DOE Contract Number:
- AC02-76CH00016
- OSTI ID:
- 6963530
- Journal Information:
- Physical Review Letters; (USA), Journal Name: Physical Review Letters; (USA) Vol. 64:8; ISSN PRLTA; ISSN 0031-9007
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
360602* -- Other Materials-- Structure & Phase Studies
ARGON
CARBON
COHERENT SCATTERING
DATA
DIFFRACTION
DIMENSIONS
ELASTIC SCATTERING
ELEMENTAL MINERALS
ELEMENTS
EXPERIMENTAL DATA
FILMS
FLUIDS
GASES
GRAPHITE
INFORMATION
LOW TEMPERATURE
MELTING
MINERALS
NEUTRON DIFFRACTION
NONMETALS
NUMERICAL DATA
PHASE TRANSFORMATIONS
RANDOMNESS
RARE GASES
SCATTERING
TEMPERATURE DEPENDENCE
THICKNESS
THIN FILMS
360602* -- Other Materials-- Structure & Phase Studies
ARGON
CARBON
COHERENT SCATTERING
DATA
DIFFRACTION
DIMENSIONS
ELASTIC SCATTERING
ELEMENTAL MINERALS
ELEMENTS
EXPERIMENTAL DATA
FILMS
FLUIDS
GASES
GRAPHITE
INFORMATION
LOW TEMPERATURE
MELTING
MINERALS
NEUTRON DIFFRACTION
NONMETALS
NUMERICAL DATA
PHASE TRANSFORMATIONS
RANDOMNESS
RARE GASES
SCATTERING
TEMPERATURE DEPENDENCE
THICKNESS
THIN FILMS