Electron- and photon-stimulated desorption: probes of structure and bonding at surfaces

Journal Article · Fri Oct 17 00:00:00 EDT 1986 · Science (Washington, D.C.); (United States)

DOI:https://doi.org/10.1126/science.234.4774.316· OSTI ID:6952935

Madey, T E

Techniques for analyzing the structure and composition of solid surfaces with electron and photon beams often cause radiation damage in samples. Damage-producing processes compete with information-producing events during measurements, and beam damage can be a series perturbation in quantitative surface analysis. There are, however, substantial benefits of electron- and photon-stimulated damage processes for studying molecules adsorbed on surfaces. Direct information about the geometric structure of surface molecules can be obtained from measurements of the angular distributions of ions released by electron- or photon-stimulated desorption. The directions of ion emission are determined by the orientation of the surface bonds that are ruptured by beam irradiation. Moreover, photon-stimulated desorption studies that make use of synchrotron radiation reveal the fundamental electronic excitations that lead to bond-breaking processes at surfaces. These measurements provide new insights into radiation-damage processes in areas as diverse as x-ray optics and semiconductor electronics.

• Research Organization: National Bureau of Standards, Gaithersburg, MD
• OSTI ID: 6952935
• Journal Information: Science (Washington, D.C.); (United States), Journal Name: Science (Washington, D.C.); (United States) Vol. 234; ISSN SCIEA
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400201* -- Chemical & Physicochemical Properties
BREMSSTRAHLUNG
CHEMICAL ANALYSIS
DESORPTION
DOCUMENT TYPES
ELECTROMAGNETIC RADIATION
ELECTRON MICROPROBE ANALYSIS
ELECTRONIC STRUCTURE
ENERGY LEVELS
EXCITED STATES
MICROANALYSIS
RADIATIONS
REVIEWS
SURFACE PROPERTIES
SYNCHROTRON RADIATION