skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Secondary ion mass spectrometric analysis of oxygen self-diffusion in single-crystal MgO

Journal Article · · Adv. Ceram.; (United States)
OSTI ID:6952173

Single-crystal layers of Mg/sup 18/O were grown epitaxially on substrates of normal MgO through chemical transport with HCl. Exchange between /sup 18/O in the crystals and the /sup 16/O present in air was produced by annealings in the temperature range of 1000-1650/sup 0/C, and diffusion coefficients were detemined from concentration gradients measured with the aid of secondary ion mass spectrometry. The temperature dependence of the oxygen self-diffusion coefficients so obtained may be represented by an activation energy of 3.24 +/- 0.13 eV and D/sub 0/ of (1.8/sub -1.1//sup +2.9/) x 10/sup -6/ cm/sup 2//s. The magnitude of the diffusivities is lower than that first obtained by exchange measurements but agrees well with recent values obtained from gradients established through proton activation analysis. The present activation energy is in the middle of the range reported in previous studies. This value is too large to represent an enthalpy for anion vacancy migration and is far too small to represent the combination of defect migration and formation enthalpies to be expected if, as presently believed, the defect structure of MgO were dominated by cation impurities. 22 references, 5 figures, 1 table.

Research Organization:
Massachusetts Institute of Technology, Cambridge
DOE Contract Number:
AC02-76ER01198
OSTI ID:
6952173
Journal Information:
Adv. Ceram.; (United States), Vol. 10
Country of Publication:
United States
Language:
English