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Surface-enhanced Raman scattering and atomic force microscopy of brass electrodes in sulfuric acid solution containing benzotriazole and chloride ion

Journal Article · · Applied Spectroscopy; (United States)
; ; ;  [1]
  1. Instituto de Quimica da Universidade de Sao Paulo (Brazil) Ames Lab., IA (United States) Iowa State Univ., Ames (United States)
Three different methods were used to roughen brass (Cu/Zn = 67/33) electrodes in 0.5 M H[sub 2]SO[sub 4] containing 1.0 mM benzotriazole (BTAH): (1) polarization at +0.05 V vs. saturated calomel for 5 min; (2) immersion in the above solution for six hours; and (3) oxidation-reduction cycling in the presence of chloride ion. The surfaces prepared by the first two methods exhibited surface-enhanced Raman scattering (SERS) spectra of the polymeric complex [Cu(I)BTA][sub s]. The SERS spectrum obtained from electrodes prepared by the third method is very similar to that of [Cu(I)CIBTAH][sub 4]. Examination of the electrodes by atomic force microscopy (AFM) showed that a large number of grain boundary sites are formed by the roughening processes. This effect is attributed to the loss of zinc, which occurs during corrosion of the mirror-like, polished brass electrode surface in the sulfuric acid solution. 11 refs., 5 figs.
DOE Contract Number:
W-7405-ENG-82
OSTI ID:
6951544
Journal Information:
Applied Spectroscopy; (United States), Journal Name: Applied Spectroscopy; (United States) Vol. 47:1; ISSN 0003-7028; ISSN APSPA4
Country of Publication:
United States
Language:
English