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Measurements of NBI and ion cyclotron range of frequency power deposition profiles using charge exchange spectroscopy

Journal Article · · Rev. Sci. Instrum.; (United States)
DOI:https://doi.org/10.1063/1.1140177· OSTI ID:6950183
Power deposition profiles of a heating neutral beam and/or an ion cyclotron range of frequency (ICRF) heating have been measured on the JIPP T-IIU tokamak. The deposition is obtained from the rise time of the ion temperature, which is measured from the Doppler broadening of C VI emission produced by charge exchange reaction between a neutral beam and a carbon impurity. The power deposition of ICRF has been found to be flatter than that of neutral beam injection (NBI). The thermal diffusivities are 4--5 times larger than the neoclassical values both in NBI and NBI+ICRF cases.
Research Organization:
Institute of Plasma Physics, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-01, Japan
OSTI ID:
6950183
Journal Information:
Rev. Sci. Instrum.; (United States), Journal Name: Rev. Sci. Instrum.; (United States) Vol. 59:8; ISSN RSINA
Country of Publication:
United States
Language:
English