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X-ray photoelectron spectroscopy analysis of the copper/arachidic acid organized molecular assembly interface: Charging phenomena

Journal Article · · Journal of Vacuum Science and Technology, A (Vacuum, Surfaces and Films); (United States)
DOI:https://doi.org/10.1116/1.578698· OSTI ID:6947127
; ;  [1]
  1. Measurements and Characterization Branch, National Renewable Energy Laboratory, Golden, Colorado 80401 (United States)

Interactions of evaporated copper with the methyl terminated surfaces of self-assembled monolayers of arachidic acid were studied with x-ray photoelectron spectroscopy (XPS). The arachidic acid [CH[sub 3](CH[sub 2])[sub 19]COOH] organized molecular assemblies (OMAs) were self-assembled on native oxide grown on freshly prepared 200 nm thick aluminum films on single crystal silicon wafers. XPS spectra were acquired as a function of evaporated copper thickness. Charging shifts of up to 0.84 eV were observed for the C(1[ital s]), O(1[ital s]), and Cu(2[ital p]) photoemission lines during evaporation of up to 4.0 nm of copper. The thickness of the organized molecular assemblies (OMA) is approximately 2.7 nm on the native oxide surface, yielding a total thickness for the oxide/OMA stack of 6--7 nm.

DOE Contract Number:
AC02-83CH10093
OSTI ID:
6947127
Journal Information:
Journal of Vacuum Science and Technology, A (Vacuum, Surfaces and Films); (United States), Journal Name: Journal of Vacuum Science and Technology, A (Vacuum, Surfaces and Films); (United States) Vol. 11:1; ISSN 0734-2101; ISSN JVTAD6
Country of Publication:
United States
Language:
English