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Title: Advances in surface-enhanced Raman spectroscopy for hazardous waste monitoring

Conference ·
OSTI ID:6940669

Surface-enhanced Raman spectroscopy is being evaluated for use as an advanced method for detecting organic contaminants in groundwater during field-screening of environmental samples. The SERS technique offers attractive and unique capabilities for detecting a wide range of organic contaminants in aqueous environments at ppm to ppb levels. An inexpensive computer-controlled portable spectrometer system coupled to a fiberoptic probe has been developed for rapid on-site and in situ determination of organic contamination in groundwater. Applications of recent advances in substrate fabrication for use with environmental samples are discussed, and critical issues pertaining to substrate durability, repeatability, sensitivity, selectivity and universality are addressed. 9 refs., 5 figs., 1 tab.

Research Organization:
Oak Ridge National Lab., TN (USA)
Sponsoring Organization:
DOE/ER
DOE Contract Number:
AC05-84OR21400
OSTI ID:
6940669
Report Number(s):
CONF-900756-21; ON: DE90015539
Resource Relation:
Conference: SPIE's international symposium on optical and optoelectronic applied science and engineering exhibit, San Diego, CA (USA), 8-13 Jul 1990
Country of Publication:
United States
Language:
English