Portable x-ray spectrometer/dosemeter based on a silicon diode

Conference · Thu Jan 01 04:00:00 EST 1987

DOI:https://doi.org/10.1093/oxfordjournals.rpd.a080724· OSTI ID:6939379

Eisen, Y; Olsher, R H; Brake, R J; Littlejohn, G J; Meddles, A

We developed a portable x-ray spectrometer/dosemeter based on a silicon p-i-n diode. The instrument is capable of obtaining spectral information in the region from 18 keV to 150 keV and measuring photon exposures in the region from 18 keV to 1.3 MeV. A theoretical method is described for obtaining a nearly air equivalent response in the energy region above 18 keV. The instrument has a dynamic range for most energies between 0.5 mR/h and 5 R/h. Its small size, ability to provide spectroscopic output, and satisfactory air equivalent response over a wide energy range, make this instrument more attractive than portable ionization chambers.

• Research Organization: Los Alamos National Lab., NM (USA)
• DOE Contract Number: W-7405-ENG-36
• OSTI ID: 6939379
• Report Number(s): LA-UR-86-3493; CONF-870219-1; ON: DE87001961
• Country of Publication: United States
• Language: English

Related Subjects

440102* -- Radiation Instrumentation-- Radiation Dosemeters
440103 -- Radiation Instrumentation-- Nuclear Spectroscopic Instrumentation
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CALIBRATION
DESIGN
DOSIMETRY
EFFICIENCY
ENERGY RANGE
ENERGY RESOLUTION
KEV RANGE
KEV RANGE 10-100
KEV RANGE 100-1000
MEASURING INSTRUMENTS
OPTIMIZATION
PERFORMANCE TESTING
RADIATION DETECTORS
RESOLUTION
SEMICONDUCTOR DETECTORS
SI SEMICONDUCTOR DETECTORS
SPECTROSCOPY
TESTING
X-RAY DOSIMETRY
X-RAY SPECTROSCOPY