Effect of the colony microstructure on transport critical current of high-J{sub c} Tl-1223 thick films
Conference
·
OSTI ID:69386
- Argonne National Lab., IL (United States)
- General Electric Co., Schenectady, NY (United States). Corporate Research and Development Center
High J{sub c}, polycrystalline, TlBa{sub 2}Ca{sub 2}Cu{sub 3}O{sub 8+x} thick films on poly-YSZ substrates were examined by x-ray microdiffraction, electron microscopy, and electron backscatter diffraction. The superconducting phase was formed by vapor phase thallination. X-ray phi scans were used to study the local and macroscopic in-plane texture. Electron backscatter kikuchi diffraction was used to discern the grains structure within the colonies. Figure shows results of a limiting path calculation of J{sub c} vs colony mosaic.
- Research Organization:
- Oak Ridge National Lab., TN (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC05-84OR21400
- OSTI ID:
- 69386
- Report Number(s):
- CONF-950637--2; ON: DE95013049
- Country of Publication:
- United States
- Language:
- English
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