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Temperature and field dependence of the critical current densities of Y-Ba-Cu-O films

Journal Article · · Appl. Phys. Lett.; (United States)
DOI:https://doi.org/10.1063/1.100429· OSTI ID:6933858
We have prepared thin films of Y/sub 1/Ba/sub 2/Cu/sub 3/O/sub 7-//sub x/ using a coevaporation technique and measured their critical current densities as a function of both temperature and field using a transport technique. For a stoichiometric composition we find that J/sub c/ at 4.2 K in zero field is 1.04 x 10/sup 6/ A/cm/sup 2/ and does not drop below 10/sup 5/ A/cm/sup 2/ until T>60 K. Fitting the data near T/sub c/ shows that J/sub c/ follows a power law of (1-t), with t being the reduced temperature. In an applied field perpendicular to the film's surface, J/sub c/ also drops slowly, and up to 90 kOe J/sub c/ >10/sup 5/ A/cm/sup 2/ for T = 4.2 K. Measurements for an off-stoichiometric film, Y/sub 1/Ba/sub 3/Cu/sub 2/O/sub 7-//sub x/, give lower J/sub c/ values that fall off faster in temperature than for stoichiometric compositions.
Research Organization:
Naval Research Laboratory, Washington, DC 20375-5000
OSTI ID:
6933858
Journal Information:
Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 53:14; ISSN APPLA
Country of Publication:
United States
Language:
English