Precision recording of near-edge profiles of x-ray absorption edges: an improved x-ray spectroscopy

Journal Article · Mon Aug 01 00:00:00 EDT 1988 · Anal. Chem.; (United States)

DOI:https://doi.org/10.1021/ac00166a017· OSTI ID:6926321

Chiu, N S; Bauer, S H

The intense, highly monochromatized X-ray beams available at the Cornell High Energy Synchroton Source facility permit one to plot the fine structure at absorption edges of elements with atomic number Z > 18. With the simple device described in this report, the authors have recorded distinctive features in absorption profiles, with a reproducibility better than +/- 50 meV for the major jumps, when measured with reference to a selected material, generally the metal. These spectra, which reflect locations of the upper states into which the photoelectrons are propelled, can be obtained without pretreatment of the sample (other than grinding to a fine powder) under ambient atmospheric conditions. Of course, spectra at low or high temperatures, under controlled atmospheres, can also be recorded with a more elaborative device. This technique complements information derived from electron energy loss spectroscopy and provides a fingerprint of modifications in the electronic structure of the element induced by the coordinating shell of surrounding atoms. It is a discriminating analytical probe for characterizing compositional changes in the first coordination shell around the selected atomic centers, due to processing of amorphous (or very finely divided) materials.

• Research Organization: Cornell Univ., Ithaca NY (USA)
• DOE Contract Number: FG22-86PC90520
• OSTI ID: 6926321
• Journal Information: Anal. Chem.; (United States), Vol. 60:15
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
MANGANESE COMPOUNDS
ABSORPTION SPECTROSCOPY
EXPERIMENTAL DATA
FINE STRUCTURE
QUALITATIVE CHEMICAL ANALYSIS
SYNCHROTRON RADIATION
SYNCHROTRON RADIATION SOURCES
X RADIATION
X-RAY SPECTRA
BREMSSTRAHLUNG
CHEMICAL ANALYSIS
DATA
ELECTROMAGNETIC RADIATION
INFORMATION
IONIZING RADIATIONS
NUMERICAL DATA
RADIATION SOURCES
RADIATIONS
SPECTRA
SPECTROSCOPY
TRANSITION ELEMENT COMPOUNDS
400102* - Chemical & Spectral Procedures