X-ray photoelectron diffraction and Auger electron diffraction from TiO{sub 2}(100)
- Surface Science Research Centre and Chemistry Department, University of Manchester, Manchester M13 9PL (United Kingdom)
- Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, California, 94720 (United States)
Full-hemispherical x-ray photoelectron (Ti2p/O1s) and x-ray stimulated Auger electron (TiL{sub 3}M{sub 23}M{sub 23}/O&hthinsp;KVV) intensity distributions have been measured from TiO{sub 2}(100)1{times}1 at relatively high-angular resolution ({plus_minus}1.8{degree}). The results are compared with theoretical calculations using a multipole {ital R}-factor analysis. Multiple scattering up to fifth order and a slab thickness of {approximately}16 {Angstrom} are needed to obtain optimum agreement with experimental photoelectron distributions. We also investigate the contribution of the final state wave function in the Auger-electron diffraction patterns and show that it is possible to determine the symmetry of the final state angular momenta for oxides such as TiO{sub 2}. Both the x-ray photoelectron diffraction and the x-ray stimulated Auger intensity distributions are found to be insensitive to details of the surface structure. {copyright} {ital 1999} {ital The American Physical Society}
- OSTI ID:
- 692557
- Journal Information:
- Physical Review, B: Condensed Matter, Journal Name: Physical Review, B: Condensed Matter Journal Issue: 16 Vol. 60; ISSN PRBMDO; ISSN 0163-1829
- Country of Publication:
- United States
- Language:
- English
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