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Photon-induced x-ray fluorescence analysis of plain brasses

Journal Article · · Appl. Spectrosc.; (United States)
An x-ray spectrometric method, using a radioisotopic radiation source, for analyzing plain brasses (binary copper-zinc alloys) has been developed. The alloys are analyzed as such without dissolving them in any solvent. Methods to correct the contribution due to Cu/sub K..beta../ to the Zn/sub K..beta../ intensity, the difference in fluorescent intensity of the two elements under consideration, and the dead time loss are discussed. The configuration of the system is given. The results obtained by the above method are compared with those obtained using atomic absorption spectrometry and with the certified values.
Research Organization:
Rensselaer Polytechnic Institute, Troy, NY
OSTI ID:
6922516
Journal Information:
Appl. Spectrosc.; (United States), Journal Name: Appl. Spectrosc.; (United States) Vol. 30:1; ISSN APSPA
Country of Publication:
United States
Language:
English