Tokamak x ray diagnostic instrumentation

Technical Report · Thu Jan 01 00:00:00 EST 1987

DOI:https://doi.org/10.2172/6921033· OSTI ID:6921033

Hill, K W; Beiersdorfer, P; Bitter, M; Fredrickson, E; Von Goeler, S; Hsuan, H; Johnson, L C; Liew, S L; McGuire, K; Pare, V

Three classes of x-ray diagnostic instruments enable measurement of a variety of tokamak physics parameters from different features of the x-ray emission spectrum. (1) The soft x-ray (1 to 50 keV) pulse-height-analysis (PHA) diagnostic measures impurity concentrations from characteristic line intensities and the continuum enhancement, and measures the electron temperature from the continuum slope. (2) The Bragg x-ray crystal spectrometer (XCS) measures the ion temperature and neutral-beam-induced toroidal rotation velocity from the Doppler broadening and wavelength shift, respectively, of spectral lines of medium-Z impurity ions. Impurity charge state distributions, precise wavelengths, and inner-shell excitation and recombination rates can also be studied. X rays are diffracted and focused by a bent crystal onto a position-sensitive detector. The spectral resolving power E/..delta..E is greater than 10/sup 4/ and time resolution is 10 ms. (3) The x-ray imaging system (XIS) measures the spatial structure of rapid fluctuations (0.1 to 100 kHZ) providing information on MHD phenomena, impurity transport rates, toroidal rotation velocity, plasma position, and the electron temperature profile. It uses an array of silicon surface-barrier diodes which view different chords of the plasma through a common slot aperture and operate in current (as opposed to counting) mode. The effectiveness of shields to protect detectors from fusion-neutron radiation effects has been studied both theoretically and experimentally.

• Research Organization: Princeton Plasma Physics Lab. (PPPL), Princeton, NJ (United States)
• DOE Contract Number: AC02-76CH03073
• OSTI ID: 6921033
• Report Number(s): PPPL-2403; ON: DE87005617
• Resource Relation: Other Information: Portions of this document are illegible in microfiche products. Original copy available until stock is exhausted
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
PLASMA DIAGNOSTICS
X-RAY SPECTRA
TOKAMAK DEVICES
BRAGG REFLECTION
PULSE ANALYZERS
SI SEMICONDUCTOR DETECTORS
X-RAY SPECTROMETERS
CLOSED PLASMA DEVICES
ELECTRONIC EQUIPMENT
EQUIPMENT
MEASURING INSTRUMENTS
RADIATION DETECTORS
REFLECTION
SEMICONDUCTOR DETECTORS
SPECTRA
SPECTROMETERS
THERMONUCLEAR DEVICES
700102* - Fusion Energy- Plasma Research- Diagnostics