X-ray absorption study of the Ge-Se system. II. GeSe sub y glasses: Bulk and thin film samples

Journal Article · Fri Sep 01 00:00:00 EDT 1989 · Journal of Solid State Chemistry; (USA)

DOI:https://doi.org/10.1016/0022-4596(89)90225-9· OSTI ID:6906844

Peyroutou, C; Peytavin, S; Ribes, M ^[1]; Dexpert, H ^[2]

---

1. Laboratoire de Physicochimie des Materiaux, Montpellier (France)
2. Universite Paris-Sud, Orsay (France)

EXAFS measurements on Se/Ge ratios greater than 2 have been undertaken for different forms of the GeSe{sub y} family, bulk or thin films. Data analysis was made both at the Ge and Se K edges and special attention was first paid to the effect of the grain size on the absorption amplitude. The results of the various investigations led to the conclusions that if the germanium tetrahedral environment is constant, that of selenium varies strongly between (i) GeSe{sub 3} and GeSe{sub y}, y > 3, and (ii) bulk phases and thin films. A model taking into account these differences is discussed, explaining these changes by the existence of selenium clustering in the more enriched Se compositions.

• OSTI ID: 6906844
• Journal Information: Journal of Solid State Chemistry; (USA), Vol. 82:1; ISSN 0022-4596
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
GERMANIUM SELENIDES
RADIATION ABSORPTION ANALYSIS
CALCULATION METHODS
DATA ANALYSIS
EXPERIMENTAL DATA
MEASURING INSTRUMENTS
MEASURING METHODS
THIN FILMS
CHALCOGENIDES
CHEMICAL ANALYSIS
DATA
FILMS
GERMANIUM COMPOUNDS
INFORMATION
NONDESTRUCTIVE ANALYSIS
NUMERICAL DATA
SELENIDES
SELENIUM COMPOUNDS
360000* - Materials
360602 - Other Materials- Structure & Phase Studies