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Title: A study of the local atomic structure in Hg[sub 0. 80]Cd[sub 0. 20]Te using x-ray diffuse scattering

Journal Article · · Journal of Materials Research; (United States)
;  [1]
  1. Department of Materials Science and Engineering, Robert R. McCormick School of Engineering and Applied Science, Northwestern University, Evanston, Illinois 60208-3100 (United States)

The local atomic arrangements in a commercial [ital n]-type wafer of Hg[sub 0.8]Cd[sub 0.2]Te were investigated by measuring the diffuse x-ray scattering in two volumes in reciprocal space. A change in contrast between the two measurements was achieved by making one volume measurement at 12037 eV and a second volume measurement at 12270 eV, i.e., near the Hg L[sub III] edge. The difference between these two measurements yielded intensity only due to Hg--Hg, Hg--Te, and Hg--Cd pair interactions. In all three patterns, peak-like features were apparent at the forbidden Bragg peak positions on thermal diffuse scattering ridges that joined major Bragg reflections; these are primarily attributed to second order displacement effects on the mixed cation sublattice. The first two Warren-Cowley short-range order parameters were determined to be [alpha] [sub 1/2 1/2 0]=[minus]0.050(26) and [alpha][sub 110]=0.118(35). Simulations of the structure revealed small ordered regions with a preference for 3:1 Hg--Cd near neighbor configurations. The near-neighbor Hg--Te bonds contract from that calculated from the average crystal's lattice parameter, and this Hg--Te distance is less than the distance in HgTe.

DOE Contract Number:
FG02-85ER45183
OSTI ID:
6899882
Journal Information:
Journal of Materials Research; (United States), Vol. 8:4; ISSN 0884-2914
Country of Publication:
United States
Language:
English