Photoionization of atoms and small molecules using synchrotron radiation. [SF/sub 6/, SiF/sub 4/]

Technical Report · Fri Oct 31 23:00:00 EST 1986

DOI:https://doi.org/10.2172/6896084· OSTI ID:6896084

Ferrett, T A

The combination of synchrotron radiation and time-of-flight electron spectroscopy has been used to study the photoionization dynamics of atoms (Li) and small molecules (SF/sub 6/, SiF/sub 4/, and SO/sub 2/). Partial cross sections and angular distribution asymmetry parameters have been measured for Auger electrons and photoelectrons as functions of photon energy. Emphasis is on the basic understanding of electron correlation and resonant effects as manifested in the photoemission spectra for these systems. 254 refs., 46 figs., 10 tabs.

• Research Organization: California Univ., Berkeley (USA)
• DOE Contract Number: AC03-76SF00098
• OSTI ID: 6896084
• Report Number(s): LBL-22418; ON: DE87004600
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400500 -- Photochemistry
640302* -- Atomic
Molecular & Chemical Physics-- Atomic & Molecular Properties & Theory
74 ATOMIC AND MOLECULAR PHYSICS
ALKALI METALS
ANGULAR DISTRIBUTION
AUGER ELECTRON SPECTROSCOPY
BINDING ENERGY
BRANCHING RATIO
BREMSSTRAHLUNG
CHALCOGENIDES
CROSS SECTIONS
DATA
DISTRIBUTION
ELECTROMAGNETIC RADIATION
ELECTRON SPECTROSCOPY
ELEMENTS
ENERGY
EXPERIMENTAL DATA
FLUORIDES
FLUORINE COMPOUNDS
HALIDES
HALOGEN COMPOUNDS
INFORMATION
IONIZATION
LITHIUM
METALS
NUMERICAL DATA
OXIDES
OXYGEN COMPOUNDS
PHOTOELECTRON SPECTROSCOPY
PHOTOIONIZATION
RADIATIONS
SILICON COMPOUNDS
SILICON FLUORIDES
SPECTROSCOPY
SULFUR COMPOUNDS
SULFUR DIOXIDE
SULFUR FLUORIDES
SULFUR OXIDES
SYNCHROTRON RADIATION