Frequency dispersion in the admittance of the polycrystalline Cu/sub 2/S/CdS solar cell

Journal Article · Thu Jan 15 00:00:00 EST 1987 · J. Appl. Phys.; (United States)

DOI:https://doi.org/10.1063/1.338228· OSTI ID:6895550

Hmurcik, L V; Serway, R A

We measured the admittance versus frequency (fless than or equal to100 kHz) for the Cu/sub 2/S/CdS solar cell. In the dark, the dispersion fits a model of a simple Debye capacitor, with deviation due to grain-boundary scattering at low frequencies. Under illumination, the dispersion becomes a function of surface roughness. Modeled in fractal geometry, the admittance varies as ( j..omega..)/sup m/. A second term of this type occurs at high frequencies and at illuminations greater than 0.1% AM1. In this case, the depletion layer extends deep into the CdS due to insufficient charge states at the interface.

• Research Organization: Physics Department, University of Bridgeport, Bridgeport, Connecticut 06601
• OSTI ID: 6895550
• Journal Information: J. Appl. Phys.; (United States), Vol. 61:2
• Country of Publication: United States
• Language: English

Related Subjects

14 SOLAR ENERGY
CADMIUM SULFIDE SOLAR CELLS
ELECTRIC IMPEDANCE
COPPER SULFIDE SOLAR CELLS
CAPACITORS
DEPLETION LAYER
FREQUENCY DEPENDENCE
ROUGHNESS
DIRECT ENERGY CONVERTERS
ELECTRICAL EQUIPMENT
EQUIPMENT
IMPEDANCE
LAYERS
PHOTOELECTRIC CELLS
PHOTOVOLTAIC CELLS
SOLAR CELLS
SOLAR EQUIPMENT
SURFACE PROPERTIES
140501* - Solar Energy Conversion- Photovoltaic Conversion