GAUSS VII: a computer program for the analysis of. gamma. -ray spectra from Ge semiconductor spectrometers

Technical Report · Fri Oct 01 04:00:00 EDT 1982

OSTI ID:6859763

McCullagh, C M; Helmer, R G

A description is given of a computer program, GAUSS VII, which has been written to determine ..gamma..-ray spectra from Ge semiconductor spectrometers. The preliminary portions of the program can determine the energy and width calibration equations, loacte individual peaks and define peak regions that are significantly above the local spectral background. The user may edit these lists of peaks and regions. Each peak region is fitted with one or more components in which the peaks are represented by a Gaussian function or a Gaussian with one or two additive exponential tails on the low-energy side and one on the high-energy side. A step-like background function can be used with each component. The program will automatically recycle to add one or more components to a region if needed to improve the fit. The ..gamma..-ray energies and intensities are computed from resulting Gaussian positions and peak areas. To allow the user to determine the best results, the results from the analyses for each region with different numbers of components can be printed and line-printer plots of the fits to the data can be made. The quality of the results depends primarily on the ability of the program to define a good spectral region for each analysis and the ability to recycle to determine the proper number of components.

• Research Organization: EG and G Idaho, Inc., Idaho Falls (USA)
• DOE Contract Number: AC07-76ID01570
• OSTI ID: 6859763
• Report Number(s): EGG-PHYS-5890; ON: DE83003721
• Country of Publication: United States
• Language: English

Related Subjects

440103* -- Radiation Instrumentation-- Nuclear Spectroscopic Instrumentation
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CALIBRATION
COMPUTER CODES
DATA ANALYSIS
FUNCTIONS
G CODES
GAMMA SPECTRA
GAMMA SPECTROMETERS
GAUSS FUNCTION
GE SEMICONDUCTOR DETECTORS
LEAST SQUARE FIT
MAXIMUM-LIKELIHOOD FIT
MEASURING INSTRUMENTS
NUMERICAL SOLUTION
RADIATION DETECTORS
SEMICONDUCTOR DETECTORS
SPECTRA
SPECTROMETERS