A time-of-flight SIMS study of the chemical nature of highly dispersed Pt on alumina

Journal Article · Tue Mar 01 00:00:00 EST 1994 · Journal of Catalysis; (United States)

DOI:https://doi.org/10.1016/0021-9517(94)90010-8· OSTI ID:6859533

Zhou, Y; Wood, M C; Winograd, N ^[1]

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1. Pennsylvania State Univ., University Park, PA (United States)

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been employed to examine the chemistry of highly dispersed Pt on alumina. In particular, the authors have characterized various negatively charged Pt cluster ions emitted from Pt powder and fresh and discharged 0.6% Pt/Al[sub 2]O[sub 3] after bombardment with 25-keV Ga[sup +] ions. For Pt powder, PtO[sup [minus]] and PtO[sup [minus][sub 2]] dominate the spectrum of negative ions, which indicates the presence of surface Pt oxides. The most important observation, however, is that PtCl[sup [minus]], PtClO[sup [minus]], and PtCl[sup [minus][sub 2]] cluster ions dominate the negative ions spectrum of 0.6% Pt/Al[sub 2]O[sub 3]. These chlorinated Pt ions provide direct spectroscopic evidence that some Cl atoms are still bound to Pt after high-temperature oxidation and reduction. 16 refs., 4 figs.

• OSTI ID: 6859533
• Journal Information: Journal of Catalysis; (United States), Vol. 146:1; ISSN 0021-9517
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
ALUMINIUM OXIDES
ION MICROPROBE ANALYSIS
PLATINUM
CATALYSTS
CHEMICAL ANALYSIS
MASS SPECTROSCOPY
OXIDATION
REDUCTION
TIME-OF-FLIGHT MASS SPECTROMETERS
ALUMINIUM COMPOUNDS
CHALCOGENIDES
CHEMICAL REACTIONS
DYNAMIC MASS SPECTROMETERS
ELEMENTS
MASS SPECTROMETERS
MEASURING INSTRUMENTS
METALS
MICROANALYSIS
NONDESTRUCTIVE ANALYSIS
OXIDES
OXYGEN COMPOUNDS
PLATINUM METALS
SPECTROMETERS
SPECTROSCOPY
TIME-OF-FLIGHT SPECTROMETERS
TRANSITION ELEMENTS
400201* - Chemical & Physicochemical Properties