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Title: Single-electron tunneling. [Microwave scanning tunneling microscope]

Technical Report ·
DOI:https://doi.org/10.2172/6854553· OSTI ID:6854553

Pictures using the low-temperature microwave scanning tunneling microscope, have been made of particles and tunneling IV characteristics determined. Strong, sometimes periodic negative differential resistance was observed in small-particle systems. Au and Ag droplets and particles were studied. 4 figs.

Research Organization:
Notre Dame Univ., IN (United States)
Sponsoring Organization:
USDOE; USDOE, Washington, DC (United States)
DOE Contract Number:
FG02-88ER45373
OSTI ID:
6854553
Report Number(s):
DOE/ER/45373-5; ON: DE93013337
Country of Publication:
United States
Language:
English