First results from the SpectroMicroscopy Beamline at the Advanced Light Source

Journal Article · Tue Jan 31 23:00:00 EST 1995 · Review of Scientific Instruments; (United States)

DOI:https://doi.org/10.1063/1.1145969· OSTI ID:6851371

Denlinger, J D ^[1]; Rotenberg, E ^[2]; Warwick, T ^[3]; Visser, G ^[4]; Nordgren, J; Guo, J; Skytt, P ^[5]; Kevan, S D; McCutcheon, K S ^[6]; Shuh, D; Bucher, J; Edelstein, N ^[7]; Tobin, J G ^[8]

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1. Advanced Light Source, Lawrence Berkeley Laboratory, Berkeley, California 94720 (United States) Department of Physics, University of Wisconsin-Milwaukee, Milwaukee, Wisconsin 53211 (United States)
2. Advanced Light Source, Lawrence Berkeley Laboratory, Berkeley, California 94720 (United States) Department of Physics, University of Oregon, Eugene, Oregon 97403 (United States)
3. Advanced Light Source, Lawrence Berkeley Laboratory, Berkeley, California 94720 (United States)
4. Department of Physics, University of California, Berkeley, California 94720 (United States)
5. Uppsala University, Uppsala, Sweden S-75121 (Sweden)
6. Department of Physics, University of Oregon, Eugene, Oregon 97403 (United States)
7. Chemical Sciences Division, Lawrence Berkeley Laboratory, Berkeley, California 94720 (United States)
8. Chemistr

The SpectroMicroscopy Facility at the Advanced Light Source is based on a high brightness, high-resolution beamline, and includes a collection of projects designed to exploit the unique characteristics of the soft x-ray beam. The beamline itself is comprised of a 5-m long, 5-cm-period undulator, a spherical-grating monochromator with water-cooled gratings. Adaptive optics refocus the monochromatic beam to two microfocus'' experimental stations with spot sizes less than 50 [mu]m diameter and a third nanofocus'' station uses a zone-plate lens to further demagnify the microfocus spot. Experimental stations include an ultraESCA'' spectrometer for small-area spectroscopy and photoelectron diffraction, a scanning transmission x-ray microscope, and photoelectron microscopes. Commissioning experiments of microscopic actinide photoemission, surface-core-level photoelectron diffraction, and high-resolution soft x-ray fluorescence demonstrate dramatic improvements in sensitivity due to the high brightness and small focus of the beamline.

• OSTI ID: 6851371
• Journal Information: Review of Scientific Instruments; (United States), Journal Name: Review of Scientific Instruments; (United States) Vol. 66:2; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

665100* -- Nuclear Techniques in Condensed Matter Physics -- (1992-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ADVANCED LIGHT SOURCE
COHERENT SCATTERING
DIFFRACTION
ELECTRON SPECTROSCOPY
EMISSION
EQUIPMENT
FLUORESCENCE
LUMINESCENCE
MICROSCOPY
MONOCHROMATORS
PHOTOEMISSION
RADIATION SOURCES
SCATTERING
SECONDARY EMISSION
SPECTROSCOPY
SYNCHROTRON RADIATION SOURCES
X-RAY DIFFRACTION
X-RAY EQUIPMENT