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Proton-enhanced diffusion and vacancy migration in silicon

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.325193· OSTI ID:6848088
Single crystals of silicon containing prediffused arsenic, boron, and phosphorus profiles are bombarded at 600--900 /sup 0/C with 250--360-keV protons. Under conditions approaching ideality (low impurity concentration and less than 10/sup 1/3 protons/cm/sup 2/ sec) enhanced impurity diffusion appears to proceed in an uncomplicated manner which is well described by steady-state kinetic treatment. At high temperatures and very low bombardment fluxes the enhanced-diffusion coefficients are observed to be temperature independent and first-order dependent upon flux. At moderately increased damage rates, particularly at lower temperatures, the diffusivities become temperature dependent and a half-order flux dependence is observed. The results are explained by assuming proton-enhanced diffusion to be controlled by the migration of split monovacancies (semivacancy pairs). Consistency with annealing studies of radiation-induced defects at much lower temperatures and with thermally activated diffusion studies at higher temperatures is attained by assuming a 1.47-eV migrational enthalpy and a 3.66-eV enthalpy of formation for the uncharged defect.
Research Organization:
IBM System Products Division, East Fishkill, Hopewell Junction, New York 12533
OSTI ID:
6848088
Journal Information:
J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 49:5; ISSN JAPIA
Country of Publication:
United States
Language:
English