Proton-enhanced diffusion and vacancy migration in silicon
Journal Article
·
· J. Appl. Phys.; (United States)
Single crystals of silicon containing prediffused arsenic, boron, and phosphorus profiles are bombarded at 600--900 /sup 0/C with 250--360-keV protons. Under conditions approaching ideality (low impurity concentration and less than 10/sup 1/3 protons/cm/sup 2/ sec) enhanced impurity diffusion appears to proceed in an uncomplicated manner which is well described by steady-state kinetic treatment. At high temperatures and very low bombardment fluxes the enhanced-diffusion coefficients are observed to be temperature independent and first-order dependent upon flux. At moderately increased damage rates, particularly at lower temperatures, the diffusivities become temperature dependent and a half-order flux dependence is observed. The results are explained by assuming proton-enhanced diffusion to be controlled by the migration of split monovacancies (semivacancy pairs). Consistency with annealing studies of radiation-induced defects at much lower temperatures and with thermally activated diffusion studies at higher temperatures is attained by assuming a 1.47-eV migrational enthalpy and a 3.66-eV enthalpy of formation for the uncharged defect.
- Research Organization:
- IBM System Products Division, East Fishkill, Hopewell Junction, New York 12533
- OSTI ID:
- 6848088
- Journal Information:
- J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 49:5; ISSN JAPIA
- Country of Publication:
- United States
- Language:
- English
Similar Records
Vacancy migration enthalpy in tungsten at high temperatures
Vacancy defect mobilities and binding energies obtained from annealing studies. [Review, migration energies, formation heat]
Annealing of As{sub Ga}-related defects in LT-GaAs: The role of gallium vacancies
Conference
·
Tue Dec 31 23:00:00 EST 1985
·
OSTI ID:7155994
Vacancy defect mobilities and binding energies obtained from annealing studies. [Review, migration energies, formation heat]
Conference
·
Sun Oct 31 23:00:00 EST 1976
·
OSTI ID:7330865
Annealing of As{sub Ga}-related defects in LT-GaAs: The role of gallium vacancies
Journal Article
·
Tue Nov 30 23:00:00 EST 1993
· Journal of Electronic Materials
·
OSTI ID:535210
Related Subjects
36 MATERIALS SCIENCE
360605* -- Materials-- Radiation Effects
BEAMS
CRYSTAL DEFECTS
CRYSTAL STRUCTURE
DIFFUSION
DOPED MATERIALS
DOSE-RESPONSE RELATIONSHIPS
ELEMENTS
ENERGY RANGE
HIGH TEMPERATURE
KEV RANGE
KEV RANGE 100-1000
NUCLEON BEAMS
PARTICLE BEAMS
PHYSICAL RADIATION EFFECTS
POINT DEFECTS
PROTON BEAMS
RADIATION EFFECTS
SEMIMETALS
SILICON
TEMPERATURE DEPENDENCE
VACANCIES
360605* -- Materials-- Radiation Effects
BEAMS
CRYSTAL DEFECTS
CRYSTAL STRUCTURE
DIFFUSION
DOPED MATERIALS
DOSE-RESPONSE RELATIONSHIPS
ELEMENTS
ENERGY RANGE
HIGH TEMPERATURE
KEV RANGE
KEV RANGE 100-1000
NUCLEON BEAMS
PARTICLE BEAMS
PHYSICAL RADIATION EFFECTS
POINT DEFECTS
PROTON BEAMS
RADIATION EFFECTS
SEMIMETALS
SILICON
TEMPERATURE DEPENDENCE
VACANCIES