Electron holography at atomic dimensions -- Present state

Journal Article · Thu Apr 01 04:00:00 EST 1999 · Materials Characterization

DOI:https://doi.org/10.1016/S1044-5803(99)00019-4· OSTI ID:684343

Lehmann, M; Lichte, H ^[1]; Geiger, D; Lang, G; Schweda, E ^[2]

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1. Technische Univ. Dresden (Germany). Inst. fuer Angewandte Physik
2. Univ. Tuebingen (Germany)

An electron microscope is a wave optical instrument where the object information is carried by an electron wave. However, an important information, the phase of the electron wave, is lost, because only intensities can be recorded in a conventional electron micrograph. Off-axis electron holography solves this phase problem by encoding amplitude and phase information in an interference pattern, the so-called hologram. After reconstruction, a rather unrestricted wave optical analysis can be performed on a computer. The possibilities as well as the current limitations of off-axis electron holography at atomic dimensions are discussed, and they are illustrated at two applications of structure characterization of {epsilon}-NbN and YBCO-1237. Finally, an electron microscope equipped with a Cs-corrector, a monochromator, and a Moellenstedt biprism is outlined for subangstrom holography.

• OSTI ID: 684343
• Journal Information: Materials Characterization, Journal Name: Materials Characterization Journal Issue: 4-5 Vol. 42; ISSN 1044-5803; ISSN MACHEX
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
BARIUM OXIDES
COPPER OXIDES
ELECTRON MICROSCOPY
ELECTRONIC STRUCTURE
ELECTRONS
HOLOGRAPHY
NIOBIUM NITRIDES
YTTRIUM OXIDES