Structure and dielectric properties of recurrent intergrowth structures formed by the Aurivillius family of bismuth oxides of the formula Bi sub 2 A sub n-1 B sub n O sub 3n+3

Journal Article · Fri Jun 01 04:00:00 EDT 1990 · Journal of Solid State Chemistry; (USA)

DOI:https://doi.org/10.1016/0022-4596(90)90136-L· OSTI ID:6827054

Subbanna, G N; Guru Row, T N; Rao, C N.R. ^[1]

---

1. Indian Institute of Science, Bangalore (India)

Crystal structures and dielectric properties of three recurrent intergrowth structures Bi{sub 9}Ti{sub 6}CrO{sub 27}, Bi{sub 9}Ti{sub 6}FeO{sub 27}, and BaBi{sub 8}Ti{sub 7}O{sub 27} formed by the Aurivillius family of bismuth oxides of the formula Bi{sub 2}A{sub n-1}B{sub n}O{sub 3n+3} are reported. The intergrowth exhibit ferroelectricity and accordingly belong to the noncentrosymmetric space group Cmm2. The ferroelectric curie temperatures of the intergrowths are in the 630-1,070 K range.

• OSTI ID: 6827054
• Journal Information: Journal of Solid State Chemistry; (USA), Journal Name: Journal of Solid State Chemistry; (USA) Vol. 86:2; ISSN 0022-4596; ISSN JSSCB
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360202* -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
BISMUTH COMPOUNDS
BISMUTH OXIDES
CHALCOGENIDES
CRYSTAL STRUCTURE
DATA
DATA ANALYSIS
DIELECTRIC PROPERTIES
ELECTRICAL PROPERTIES
ELEMENTS
EXPERIMENTAL DATA
INFORMATION
MEASURING INSTRUMENTS
MEASURING METHODS
METALS
NUMERICAL DATA
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
TITANIUM
TRANSITION ELEMENTS