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Review of ultraviolet damage threshold measurements at Lawrence Livermore National Laboratory

Conference ·
OSTI ID:6824288

The results of damage threshold measurements made at LLNL using ultraviolet wavelength laser pulses are reviewed. Measurements were made with pulses from a krypton fluoride laser with wavelength of 248 nm and pulse duration of 20 ns and with Nd-glass laser pulses converted to the third harmonic wavelength of 355 nm with duration of 0.6 ns. Measurements are presented for transparent window materials, crystals and harmonic generation, single layer dielectric films of oxide and fluoride materials and multilayer high reflectivity and antireflective coatings.

Research Organization:
Lawrence Livermore National Lab., CA (USA)
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
6824288
Report Number(s):
UCRL-90866; CONF-8404124-8; ON: DE84012956
Country of Publication:
United States
Language:
English