Studies on arrays of Josephson tunnel junction interferometers
Journal Article
·
· J. Vac. Sci. Technol.; (United States)
Josephson-junction interferometers have previously been proposed as memory devices in which information is stored as a single flux quantum, (SFQ). To investigate the feasibility of making large arrays of SFQ cells suitable for the memory of a cryogenic computer, arrays containing 80 interferometers have been made and measured. The prime objective was to determine the distribution of the dc Josephson current i/sub 1/ within the arays and to compare it with the design value required for successful operation of all cells in high density arrays. The results show that a substantial fraction of the arrays has standard deviations in i/sub 1/ less than the maximum allowable, thus demonstrating for the first time that such a memory can be made with present technology. The fabrication, measurement technique and a detailed analysis of the current distributions on the arrays are presented.
- Research Organization:
- IBM Zurich Research Laboratory, 8803 Rueschlikon, Switzerland
- OSTI ID:
- 6819540
- Journal Information:
- J. Vac. Sci. Technol.; (United States), Journal Name: J. Vac. Sci. Technol.; (United States) Vol. 15:3; ISSN JVSTA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
420201* -- Engineering-- Cryogenic Equipment & Devices
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
CRYOGENIC STORAGE DEVICES
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELECTRONIC CIRCUITS
ELECTRONIC EQUIPMENT
FABRICATION
FEASIBILITY STUDIES
FLUXMETERS
INTEGRATED CIRCUITS
INTERFEROMETERS
JOSEPHSON JUNCTIONS
MEASURING INSTRUMENTS
MEMORY DEVICES
MICROELECTRONIC CIRCUITS
MICROWAVE EQUIPMENT
PHYSICAL PROPERTIES
SQUID DEVICES
SUPERCONDUCTING DEVICES
SUPERCONDUCTING JUNCTIONS
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
CRYOGENIC STORAGE DEVICES
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELECTRONIC CIRCUITS
ELECTRONIC EQUIPMENT
FABRICATION
FEASIBILITY STUDIES
FLUXMETERS
INTEGRATED CIRCUITS
INTERFEROMETERS
JOSEPHSON JUNCTIONS
MEASURING INSTRUMENTS
MEMORY DEVICES
MICROELECTRONIC CIRCUITS
MICROWAVE EQUIPMENT
PHYSICAL PROPERTIES
SQUID DEVICES
SUPERCONDUCTING DEVICES
SUPERCONDUCTING JUNCTIONS