CVD diamond films for radiation detection

Conference · Mon Aug 01 04:00:00 EDT 1994 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

OSTI ID:6816006

Foulon, F; Pochet, T ^[1]; Gheeraert, E; Deneuville, A ^[2]

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1. Centre d'Etudes de Saclay, Gif-sur-Yvette (France)
2. Lab. d'Etudes des Proprietes Electroniques des Solides, Grenoble (France)

Diamond films produced by microwave plasma enhanced chemical vapor deposition (CVD) technique have been used to fabricate radiation detectors. The polycrystalline diamond films have a measured resistivity of 10[sup 12] [Omega].cm, a carrier mobility of 280 cm[sup 2]/V.s and a carrier lifetime of about 530 ps. The detector response to laser pulses ([lambda] = 355, 532 and 1,064 nm), X-ray flux (15--50 keV) and alpha particles ([sup 241]Am, 5.49 MeV) has been investigated. The response speed of the detector is in the 100 ps range. A sensitivity of about 3 [times] 10[sup [minus]10] A/V. (Gy/s) was measured under 50 keV X-ray flux. The detector current response to X-ray flux is almost linear. It is also shown that CVD diamond detectors can be used for alpha particle counting.

• OSTI ID: 6816006
• Report Number(s): CONF-931051--
• Conference Information: Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Journal Volume: 41:4Pt1
• Country of Publication: United States
• Language: English

Related Subjects

440101* -- Radiation Instrumentation-- General Detectors or Monitors & Radiometric Instruments
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ALPHA DETECTION
CHARGED PARTICLE DETECTION
DATA
DETECTION
ELECTRICAL PROPERTIES
EXPERIMENTAL DATA
FABRICATION
FUNCTIONS
INFORMATION
MEASURING INSTRUMENTS
NUMERICAL DATA
PERFORMANCE
PHYSICAL PROPERTIES
RADIATION DETECTION
RADIATION DETECTORS
RESPONSE FUNCTIONS
SEMICONDUCTOR DETECTORS
SENSITIVITY
X-RAY DETECTION