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Compositional distribution in the cross section of chemical-vapor-deposited Nb/sub 3/Ge tape conductors and its correlation with superconducting properties

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.338821· OSTI ID:6815935
Chemical-vapor-deposited Nb/sub 3/Ge tapes 2.5 mm wide with Nb/sub 3/Ge layer thickness of 5--60 ..mu..m were prepared under various processing conditions. Though the depth profile of the Nb concentration in the Nb/sub 3/Ge tapes determined by x-ray microanalysis was fairly uniform, with a variation less than 4 at. % for many Nb/sub 3/Ge tapes, the distribution of the Nb concentration over the whole cross section of the Nb/sub 3/Ge layer varied considerably, with a variation of 10--18 at. % for various Nb/sub 3/Ge tapes. In this distribution, Nb concentrations at the tape edges were found to be higher than those on its sides for all of the Nb/sub 3/Ge tapes prepared. The origin of this singular distribution of the composition is discussed. The T/sub c/ values for narrower tapes cut out lengthwise from the 2.5-mm-wide tapes were measured resistively. They correlated closely with the compositional distribution in the cross section of the Nb/sub 3/Ge tapes. The T/sub c/ values (midpoints) of Nb/sub 3/Ge tapes incorporating compositions within the Nb concentration range of 70--75 at. % were found to be near or above 20 K.
Research Organization:
Advanced Technology Division, Electrotechnical Laboratory, 1-1-4, Umezono, Sakura-mura, Niihari-gun, Ibaraki 305, Japan
OSTI ID:
6815935
Journal Information:
J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 61:1; ISSN JAPIA
Country of Publication:
United States
Language:
English