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Deuterium profilemetry and diffusion coefficient in electrocharged stainless steel

Conference ·
OSTI ID:6814126
The method of nuclear microanalysis using the reaction D(d,p)T is used to measure concentration-depth profiles of deuterium in austenitic Type 310 stainless steel electrocharged in 1 N D/sub 2/SO/sub 4/ with arsenic poison at room temperature. The influence of aging after charging is examined. A near-surface density of 0.6 deuterium atoms per metal atom (i.e., 38 at. %) is found for the initially charged condition. Associated with this high gas concentration is considerable microstructural damage. An analysis of the deuterium depth profiles yields a room-temperature diffusion coefficient for deuterium of 1.4 x 10/sup -16/ m/sup 2/s/sup -1/ at high concentrations which is consistent with extrapolation of higher-temperature data available from other techniques for annealed material. At lower deuterium concentrations, < 10/sup -2/, in the aged material the extracted diffusion coefficient is a factor of three higher, implying a dependence on concentration. At concentrations < 10/sup -3/, diffusion may be hindered by dislocation trapping.
Research Organization:
Oak Ridge National Lab., TN (USA)
DOE Contract Number:
W-7405-ENG-26
OSTI ID:
6814126
Report Number(s):
CONF-800850-2
Country of Publication:
United States
Language:
English