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Title: The Leitz QUINDOS coordinate measuring machine process

Conference ·
OSTI ID:6808831

QUINDOS is a software system developed by Ernst Leitz Wetzler GmbH of the Federal Republic of Germany as an analytical and control system for coordinate measuring machines. The system is operating on a Leitz 12-10-6 precision measuring machine in the main inspection shop at Lawrence Livermore Laboratory. The QUINDOS Program is a sophisticated process which provides the user with a challenging degree of freedom. An EDT-like editor is used to build the program which is executable at random. Each program line may contain a holographic volume of information or be a call to a subroutine, which in QUINDOS, is called a procedure. Program execution is moderated through the use of fortran-like loops and conditional branching statements. A full selection of math functions and variables can interact with a variety of geometric pattern functions to create evenly distributed arrays of probing points. The gathering of data is further enhanced by the 3D scanning abilities of the QUINDOS system. Data analysis of standard geometric elements is enhanced through interation control of parameters, such as fixing the origin of a circle and fitting only the radius. Two dimensional analysis is achieved through spline fit comparisons. Three dimensional analysis of part profile is achieved through the direct comparison of nominal and measured points. Output formats, like most everything in QUINDOS, are under the control of the programmer. The degree of control is largely determined by the knowledge and volition of the programmer rather than by the limitations of the system.

Research Organization:
Lawrence Livermore National Lab., CA (USA)
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
6808831
Report Number(s):
UCRL-99354; CONF-8808132-1; ON: DE88016276
Resource Relation:
Conference: Interagency Mechanical Operations Group gaging subgroup coordinate measurement machine users seminar, Oak Ridge, TN, USA, 9 Aug 1988; Other Information: Portions of this document are illegible in microfiche products
Country of Publication:
United States
Language:
English