The Einstein Observatory Extended Medium-Sensitivity Survey. I. X-ray data and analysis

Journal Article · Thu Mar 01 04:00:00 EST 1990 · Astrophysical Journal, Supplement Series; (USA)

DOI:https://doi.org/10.1086/191426· OSTI ID:6806762

Gioia, I M; Maccacaro, T; Schild, R E; Wolter, A; Stocke, J T ^[1]

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1. Harvard-Smithsonian Center for Astrophysics, Cambridge, MA (USA) Colorado Univ., Boulder (USA)

This paper presents the results of the analysis of the X-ray data and the optical identification for the Einstein Observatory Extended Medium-Sensitivity Survey (EMSS). The survey consists of 835 serendipitous sources detected at or above 4 times the rms level in 1435 imaging proportional counter fields with centers located away from the Galactic plane. Their limiting sensitivities are about (5-300) x 10 to the -14th ergs/sq cm sec in the 0.3-3.5-keV energy band. A total area of 778 square deg of the high-Galactic-latitude sky has been covered. The data have been analyzed using the REV1 processing system, which takes into account the nonuniformities of the detector. The resulting EMSS catalog of X-ray sources is a flux-limited and homogeneous sample of astronomical objects that can be used for statistical studies. 82 refs.

• OSTI ID: 6806762
• Journal Information: Astrophysical Journal, Supplement Series; (USA), Journal Name: Astrophysical Journal, Supplement Series; (USA) Vol. 72; ISSN APJSA; ISSN 0067-0049
• Country of Publication: United States
• Language: English

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