Analysis with electron microscope of multielement samples using pure element standards
Patent
·
OSTI ID:6803732
This disclosure describes a method and modified analytical electron microscope for determining the concentration of elements in a multielement sample by exposing samples with differing thicknesses for each element to a beam of electrons. Simultaneously the electron dosage and x-ray intensities are measured for each sample of element to determine a ''K/sub AB/'' value to be used in the equation (I/sub A/I/sub B/) = K/sub AB/ (C/sub A//C/sub B/), where I is intensity and C is concentration for elements A and B. The multielement sample is exposed to determine the concentrations of the elements in the sample.
- Research Organization:
- Argonne National Lab., IL (USA)
- DOE Contract Number:
- W-31109-ENG-38
- Assignee:
- Dept. of Energy
- Patent Number(s):
- None
- Application Number:
- ON: DE87007290
- OSTI ID:
- 6803732
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400102* -- Chemical & Spectral Procedures
440300 -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
APERTURES
BEAMS
CHEMICAL ANALYSIS
ELECTRON BEAMS
ELECTRON GUNS
ELECTRON MICROSCOPES
ELECTRON MICROSCOPY
LEPTON BEAMS
MICROSCOPES
MICROSCOPY
MULTI-ELEMENT ANALYSIS
NONDESTRUCTIVE ANALYSIS
OPENINGS
PARTICLE BEAMS
SAMPLE HOLDERS
X-RAY EMISSION ANALYSIS
400102* -- Chemical & Spectral Procedures
440300 -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
APERTURES
BEAMS
CHEMICAL ANALYSIS
ELECTRON BEAMS
ELECTRON GUNS
ELECTRON MICROSCOPES
ELECTRON MICROSCOPY
LEPTON BEAMS
MICROSCOPES
MICROSCOPY
MULTI-ELEMENT ANALYSIS
NONDESTRUCTIVE ANALYSIS
OPENINGS
PARTICLE BEAMS
SAMPLE HOLDERS
X-RAY EMISSION ANALYSIS