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The limited role of surface defects as nucleation sites for CuO{sub 2} on Cu(001)

Journal Article · · Journal of the Electrochemical Society
DOI:https://doi.org/10.1149/1.1391898· OSTI ID:680025
; ;  [1];  [2]
  1. Univ. of Illinois, Urbana, IL (United States). Frederic Seitz Materials Research Lab.
  2. National Univ. of Singapore (Singapore). Inst. of Materials Research and Engineering
The authors have observed the initial oxidation stages of Cu(001) thin films by in situ ultrahigh vacuum-transmission electron microscopy, examining the role of surface defects, such as surface steps, as possible nucleation sites for the Cu{sub 2}O on Cu(001) due to oxidation. Weak beam techniques were used to image surface steps. In contrast to previous speculations, the authors did not observe evidence that surface steps are preferential nucleation sites.
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
FG02-91ER45439
OSTI ID:
680025
Journal Information:
Journal of the Electrochemical Society, Journal Name: Journal of the Electrochemical Society Journal Issue: 6 Vol. 146; ISSN 0013-4651; ISSN JESOAN
Country of Publication:
United States
Language:
English

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