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Significance of a correlation of blister diameter with skin thickness for Ni and Be for blistering models

Conference ·
OSTI ID:6796937
It has been suggested that large lateral stresses introduced in an ion implanted surface layer may cause elastic instability and buckling of the implant layer (blister formation), and result in a relationship D/sub mp/ varies as t/sup 3///sup 2/ between the most probable blister diameter D/sub mp/ and the blister skin thickness, t, for metals such as Be, V, stainless steel, Nb and Mo. To test this relationship a systematic study of the correlation between blister diameter and skin thickness for helium blistering of annealed polycrystalline Ni and Be has been conducted for helium ion energies in the range of 15-300 keV. For beryllium the relationship between D/sub mp/ (..mu..m) and t(..mu..m) can be fitted by the expression D/sub mp/ = 24.6t/sup 1/./sup 25/ whereas for nickel a best fit is obtained for the expression D/sub mp/ = 1.24t/sup 1/./sup 15/. These results, together with our earlier results for Nb and V, show that the relationship between D/sub mp/ and t is strongly dependent on the type of metal studied and do not support the lateral stress model for blister formation.
Research Organization:
Argonne National Lab., Ill. (USA)
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
6796937
Report Number(s):
CONF-780467-4
Country of Publication:
United States
Language:
English

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