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Title: Large area silicon drift detectors for x-rays -- New results

Journal Article · · IEEE Transactions on Nuclear Science
DOI:https://doi.org/10.1109/23.775529· OSTI ID:679570
; ; ;  [1];  [2];  [3]; ;  [4]
  1. Photon Imaging, Inc., Northridge, CA (United States)
  2. Univ. of Hawaii, Honolulu, HI (United States). Dept. of Physics
  3. Jet Propulsion Lab., Pasadena, CA (United States)
  4. Stanford Univ., CA (United States)

Large area silicon drift detectors, consisting of 8 mm and 12 mm diameter hexagons, were fabricated on 0.35 mm thick high resistivity n-type silicon. An external FET and a low-noise charge sensitive preamplifier were used for testing the prototype detectors. The detector performance was measured in the range {minus}75 to 25 C using Peltier cooling, and from 0.125 to 6 {micro}s amplifier shaping time. Measured energy resolutions were 159 eV FWHM and 263 eV FWHM for the 0.5 cm{sup 2} and 1 cm{sup 2} detectors, respectively (at 5.9 keV, {minus}75 C, 6 {micro}s shaping time). The uniformity of the detector response over the entire active area (measured using 560 nm light) was <0.5%.

Sponsoring Organization:
National Insts. of Health, Bethesda, MD (United States); USDOE, Washington, DC (United States); National Aeronautics and Space Administration, Washington, DC (United States)
DOE Contract Number:
FG03-97ER82450
OSTI ID:
679570
Report Number(s):
CONF-981110-; ISSN 0018-9499; TRN: 99:009502
Journal Information:
IEEE Transactions on Nuclear Science, Vol. 46, Issue 3Pt1; Conference: 1998 IEEE nuclear science symposium and medical imaging conference, Toronto (Canada), 10-12 Nov 1998; Other Information: PBD: Jun 1999
Country of Publication:
United States
Language:
English