Large area silicon drift detectors for x-rays -- New results
Journal Article
·
· IEEE Transactions on Nuclear Science
- Photon Imaging, Inc., Northridge, CA (United States)
- Univ. of Hawaii, Honolulu, HI (United States). Dept. of Physics
- Jet Propulsion Lab., Pasadena, CA (United States)
- Stanford Univ., CA (United States)
Large area silicon drift detectors, consisting of 8 mm and 12 mm diameter hexagons, were fabricated on 0.35 mm thick high resistivity n-type silicon. An external FET and a low-noise charge sensitive preamplifier were used for testing the prototype detectors. The detector performance was measured in the range {minus}75 to 25 C using Peltier cooling, and from 0.125 to 6 {micro}s amplifier shaping time. Measured energy resolutions were 159 eV FWHM and 263 eV FWHM for the 0.5 cm{sup 2} and 1 cm{sup 2} detectors, respectively (at 5.9 keV, {minus}75 C, 6 {micro}s shaping time). The uniformity of the detector response over the entire active area (measured using 560 nm light) was <0.5%.
- Sponsoring Organization:
- National Insts. of Health, Bethesda, MD (United States); USDOE, Washington, DC (United States); National Aeronautics and Space Administration, Washington, DC (United States)
- DOE Contract Number:
- FG03-97ER82450
- OSTI ID:
- 679570
- Report Number(s):
- CONF-981110-; ISSN 0018-9499; TRN: 99:009502
- Journal Information:
- IEEE Transactions on Nuclear Science, Vol. 46, Issue 3Pt1; Conference: 1998 IEEE nuclear science symposium and medical imaging conference, Toronto (Canada), 10-12 Nov 1998; Other Information: PBD: Jun 1999
- Country of Publication:
- United States
- Language:
- English
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