Analysis of free-electron-laser performance utilizing the National Bureau of Standards' CW microtron
Technical Report
·
OSTI ID:6777989
The National Bureau of Standards' (NBS) CW racetrack microtron (RTM) will be utilized as a driver for a free-electron-laser (FEL) oscillator. The NBS RTM possesses many exceptional properties of value for the FEL; i) CW operation, ii) energy from 20-185 MeV, iii) small energy spread and emittance, iv) excellent energy stability, and v) high average power. The 1-D FEL gain formula predicts that the FEL would oscillate at the fundamental approximately from 0.25 to 10 micrometers when upgrading the peak current to greater than or equal to 2 A. This paper presents 3-D self-consistent numerical results, including several realistic effects, such as emittance, betatron oscillations, diffraction and refraction. The results indicate that the design value of the transverse emittance is small enough that it does not degrade the FEL performance for intermediate to long wavelengths, and only slightly degrades the performance at the shortest wavelength under consideration. Due to the good emittance, the current density is high enough that focusing, or guiding, begins to manifest itself for wavelengths > 2.0 micrometers.
- Research Organization:
- National Bureau of Standards, Washington, DC (USA)
- OSTI ID:
- 6777989
- Report Number(s):
- AD-A-194217/6/XAB
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
42 ENGINEERING
420300* -- Engineering-- Lasers-- (-1989)
ACCELERATORS
AMPLIFICATION
BEAM EMITTANCE
BETATRONS
CURRENT DENSITY
CYCLIC ACCELERATORS
CYCLOTRONS
ELECTRONIC EQUIPMENT
EQUIPMENT
FREE ELECTRON LASERS
GAIN
LASERS
MICROTRONS
OPERATION
OSCILLATORS
PERFORMANCE
RACETRACK MICROTRONS
REFRACTION
STABILITY
420300* -- Engineering-- Lasers-- (-1989)
ACCELERATORS
AMPLIFICATION
BEAM EMITTANCE
BETATRONS
CURRENT DENSITY
CYCLIC ACCELERATORS
CYCLOTRONS
ELECTRONIC EQUIPMENT
EQUIPMENT
FREE ELECTRON LASERS
GAIN
LASERS
MICROTRONS
OPERATION
OSCILLATORS
PERFORMANCE
RACETRACK MICROTRONS
REFRACTION
STABILITY