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Title: Effects of discharge parameters on deposition rate of hydrogenated amorphous silicon for solar cells from pure SiH/sub 4/ plasma

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.339771· OSTI ID:6773697

A systematic deposition of hydrogenated amorphous silicon films from pureSiH/sub 4/ plasma was made in a capacitively coupled RF glow-discharge system by changing anode--cathode spacing d and chamber pressure p simultaneously. The data of the deposition rate in the p-vs-d space had two boundaries. One was pd = const. The other seems to be pd/sup 2/ = const. The RF plasma can stably sustain between the boundaries. The boundaries are discussed with RF power per SiH/sub 4/ molecule and with overlapping Paschen's lines of various fragments, especially H/sub 2/ due to the SiH/sub 4/ dissociation. We found the optimum conditions in which the deposition rate was more than 10 A/s without large photo-induced degradation. 10% efficient p-i-n solar cells were achieved with the intrinsic layer deposition rate of 3.9 A/s and more than 6% efficiency with 10 A/s.

Research Organization:
Central Research Laboratories, Matsushita Electric Industrial Co., Ltd., Moriguchi, Osaka 570, Japan
OSTI ID:
6773697
Journal Information:
J. Appl. Phys.; (United States), Vol. 62:2
Country of Publication:
United States
Language:
English