Arc-evaporated carbon films: optical properties and electron mean free paths
This paper describes briefly a method which can be used to calculate inelastic mean free paths for electrons with energies in the range of interest for the interpretation of surface phenomena. This method requires a knowledge of the optical properties of the material for the photon energies associated with the oscillator strength of the valence electrons. However, in general it is easier to obtain accurate values of the required properties than it is to measure the electron attenuation lengths in the energy region of interest. This technique, demonstrated here for arc-evaporated carbon, can be used for any material for which the optical properties can be measured over essentially the whole energy range corresponding to the valence electron response.
- Research Organization:
- Oak Ridge National Lab., TN (USA); Oak Ridge Associated Universities, Inc., TN (USA)
- DOE Contract Number:
- AC05-84OR21400
- OSTI ID:
- 6767684
- Report Number(s):
- CONF-840617-7; ON: DE85001246
- Resource Relation:
- Conference: 12. DOE surface science/SUBWOG - 7. SUBWOG - 12B technical exchange meeting, Oak Ridge, TN, USA, 11 Jun 1984
- Country of Publication:
- United States
- Language:
- English
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