Induced critical current density limit of Ag sheathed Bi-2223 tape conductor

Conference · Fri Jul 01 04:00:00 EDT 1994 · IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States)

OSTI ID:6766926

Ogiwara, H; Satou, M; Yamada, Y ^[1]; Kitamura, T; Hasegawa, T ^[2]

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1. Toshiba Research and Development Center, Kawasaki (Japan)
2. Showa Electric Wire and Cable Co., Ltd., Kawasaki (Japan)

The authors have already reported the best critical current density of 66,000 A/cm[sup 2] with an Ag sheathed Bi-2223 tape conductor. The Brick-wall model is for explaining the current transport mechanism of this conductor. The model has its roots in the fact that the Bi-2223 tape core is a complicated stack of crystals which have a mica-flake structure. The orientation of the crystals which have a mica-flake structure. The orientation of the crystals seriously affects the current transport capability. Moreover, the contacts between the stacking crystals are very important. The transport current flows dividing into many branch paths. Under high magnetic field, the different paths experienced different electromagnetic forces. Differences between the electromagnetic forces on the different crystals can affect the contacts so as to increase resistivity and decrease overall critical current density of the tape. This effect can foretell the limit of the critical current density obtainable with these kinds of conductors.

• OSTI ID: 6766926
• Report Number(s): CONF-930926--
• Conference Information: Journal Name: IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States) Journal Volume: 30:4Pt2
• Country of Publication: United States
• Language: English

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