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Threshold electron excitation of Auger-electron and x-ray emissions in La

Journal Article · · J. Vac. Sci. Technol., A; (United States)
DOI:https://doi.org/10.1116/1.572494· OSTI ID:6761645
The intensities of the M/sub 5/O/sub 3/ and M/sub 5/N/sub 3/ characteristic x-ray lines and the M/sub 5/N/sub 4,5/N/sub 4,5/ Auger-electron line from La were measured as functions of the electron excitation energy near the M/sub 5/ ionization energy. The excitation curve of each of these emissions contains a linelike structure a few eV above the threshold. The full width at half maximum (3.0 +- 0.2 eV) and relative height (4 x ) of this structure are the same in these three excitation curves; however, they are different than the respective values (2.3 +- 0.2 eV and 200 x ) we previously measured for a resonant bremsstrahlung emission observed when the electron excitation energy was near the M/sub 5/ ionization energy. These results support our earlier proposal that two distinct states are excited for near threshold, electron excitation of the La M/sub 5/ level: the 3d/sup 9/4f /sup 0/ state which decays via the M/sub 5/ series characteristic x-ray and Auger-electron emissions, and the 3d /sup 9/4f /sup 2/ intermediate bound state which appears to decay by only a single channel: the emission of a resonant x ray with a photon energy of 832 +- 1 eV. These results may be evidence of a closed channel resonance in the electron scattering cross section in solid La, similar to resonances found in Ne gas.
Research Organization:
Sandia National Laboratories, Albuquerque, New Mexico 87185
DOE Contract Number:
AC04-76DP00789
OSTI ID:
6761645
Journal Information:
J. Vac. Sci. Technol., A; (United States), Journal Name: J. Vac. Sci. Technol., A; (United States) Vol. 2:2; ISSN JVTAD
Country of Publication:
United States
Language:
English