Normal incidence x-ray mirror for chemical microanalysis

Patent · 05 August 1987

OSTI ID:6761509

Carr, M J; Romig, Jr, A D

An x-ray mirror for both electron column instruments and micro x-ray fluorescence instruments for making chemical, microanalysis comprises a non-planar mirror having, for example, a spherical reflecting surface for x-rays comprised of a predetermined number of alternating layers of high atomic number material and low atomic number material contiguously formed on a substrate and whose layers have a thickness which is a multiple of the wavelength being reflected. For electron column instruments, the wavelengths of interest lie above 1.5nm, while for x-ray fluorescence instruments, the range of interest is below 0.2nm. 4 figs.

• Research Organization: Sandia National Labs., Albuquerque, NM (USA)
• DOE Contract Number: AC04-76DP00789
• Assignee: SNL; EDB-88-186307; ERA-14-001599
• Patent Number(s): PATENTS-US-A6081964
• OSTI ID: 6761509
• Country of Publication: United States
• Language: English

Related Subjects

440300* -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
ABSORPTION
BEAMS
CHEMICAL ANALYSIS
DESIGN
ELECTRON BEAMS
EQUIPMENT
INVENTIONS
LEPTON BEAMS
MIRRORS
NONDESTRUCTIVE ANALYSIS
PARTICLE BEAMS
X-RAY EMISSION ANALYSIS
X-RAY EQUIPMENT
X-RAY FLUORESCENCE ANALYSIS