Time-resolved x-ray scattering instrumentation
Patent
·
OSTI ID:6758383
An apparatus and method for increased speed and efficiency of data compilation and analysis in real time is presented in this disclosure. Data is sensed and grouped in combinations in accordance with predetermined logic. The combinations are grouped so that a simplified reduced signal results, such as pairwise summing of data values having offsetting algebraic signs, thereby reducing the magnitude of the net pair sum. Bit storage requirements are reduced and speed of data compilation and analysis is increased by manipulation of shorter bit length data values, making real time evaluation possible.
- Research Organization:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- DOE Contract Number:
- W-31-109-ENG-38
- Assignee:
- Dept. of Energy
- Application Number:
- ON: DE87007274
- OSTI ID:
- 6758383
- Resource Relation:
- Other Information: Portions of this document are illegible in microfiche products
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
47 OTHER INSTRUMENTATION
RADIATION DETECTORS
DATA ACQUISITION
DATA ANALYSIS
X-RAY DIFFRACTION
BACKGROUND RADIATION
COMPUTER CALCULATIONS
INTEGRATED CIRCUITS
LEAST SQUARE FIT
PHOTODETECTORS
SMALL ANGLE SCATTERING
X-RAY DETECTION
COHERENT SCATTERING
DETECTION
DIFFRACTION
ELECTRONIC CIRCUITS
MAXIMUM-LIKELIHOOD FIT
MEASURING INSTRUMENTS
MICROELECTRONIC CIRCUITS
NUMERICAL SOLUTION
RADIATION DETECTION
RADIATIONS
SCATTERING
440300* - Miscellaneous Instruments- (-1989)
RADIATION DETECTORS
DATA ACQUISITION
DATA ANALYSIS
X-RAY DIFFRACTION
BACKGROUND RADIATION
COMPUTER CALCULATIONS
INTEGRATED CIRCUITS
LEAST SQUARE FIT
PHOTODETECTORS
SMALL ANGLE SCATTERING
X-RAY DETECTION
COHERENT SCATTERING
DETECTION
DIFFRACTION
ELECTRONIC CIRCUITS
MAXIMUM-LIKELIHOOD FIT
MEASURING INSTRUMENTS
MICROELECTRONIC CIRCUITS
NUMERICAL SOLUTION
RADIATION DETECTION
RADIATIONS
SCATTERING
440300* - Miscellaneous Instruments- (-1989)