Structure and phases of the Au(001) surface: X-ray scattering measurements

Journal Article · Mon Jun 11 04:00:00 EDT 1990 · Physical Review Letters; (USA)

DOI:https://doi.org/10.1103/PhysRevLett.64.2925· OSTI ID:6755004

Mochrie, S G.J. ^[1]; Zehner, D M ^[2]; Ocko, B M; Gibbs, D ^[3]

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1. Physics Department, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139 (USA)
2. Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN (USA)
3. Physics Department, Brookhaven National Laboratory, Upton, NY (USA)

X-ray diffraction is used to study the phase behavior and structure of the Au(001) surface between 300 K and the triple point. For {ital T}{gt}1170 K, the x-ray reflectivity is consistent with a thin, disordered surface film. At 1170 K, there is a reversible transition to an incommensurate, hexagonal overlayer on top of the square substrate. At 970 K, the orientation of the hexagonal layer rotates discontinuously by 0.81{degree} with no observable change in incommensurability.

• DOE Contract Number: AC02-76CH00016; AC05-84OR21400
• OSTI ID: 6755004
• Journal Information: Physical Review Letters; (USA), Journal Name: Physical Review Letters; (USA) Vol. 64:24; ISSN PRLTA; ISSN 0031-9007
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360102* -- Metals & Alloys-- Structure & Phase Studies
COHERENT SCATTERING
CRYSTAL STRUCTURE
DATA
DIFFRACTION
ELEMENTS
EXPERIMENTAL DATA
FILMS
GOLD
HIGH TEMPERATURE
INFORMATION
MEDIUM TEMPERATURE
METALS
NUMERICAL DATA
OPTICAL PROPERTIES
ORIENTATION
PHASE STUDIES
PHYSICAL PROPERTIES
REFLECTIVITY
SCATTERING
SURFACE PROPERTIES
THIN FILMS
TRANSITION ELEMENTS
TRIPLE POINT
VERY HIGH TEMPERATURE
X-RAY DIFFRACTION