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Title: Electronic structure of ceramics and thin-film samples of high T/sub c/ Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8+//sub delta/ superconductors: Effects of Ar/sup +/ sputtering, O/sub 2/ exposure, and Rb deposition

Journal Article · · Appl. Phys. Lett.; (United States)
DOI:https://doi.org/10.1063/1.100672· OSTI ID:6749275

The electronic structure of bulk, and, for the first time, thin-film samples of the new class of high T/sub c/ Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8+//sub delta/ superconductors, is investigated by photoemission spectroscopy using synchrotron radiation. Ar/sup +/ sputtering and Rb deposition result in disrupted Bi O bonds and subsequent change in the valency of Bi, while oxygen adsorption or annealing in oxygen is found to restore the Bi O bonds. The results also show that adsorbates of O/sub 2/ and/or Rb readily give rise to a number of new oxygen states in the valence band of Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8+//sub delta/. The Ar/sup +/-sputtered film is found to be more sensitive to adsorbates of O/sub 2/ and Rb than the scraped bulk sample, as monitored by the Bi 5d core shifts and the oxygen-induced valence-band states.

Research Organization:
Stanford Electronics Laboratories, Stanford University, Stanford, California 94305
OSTI ID:
6749275
Journal Information:
Appl. Phys. Lett.; (United States), Vol. 53:20
Country of Publication:
United States
Language:
English